Magnetic Force Microscope Tips Prepared by Coating Sharp Si-Base Tips with Thin Co Films
نویسندگان
چکیده
منابع مشابه
Calibration of atomic-force microscope tips
Images and force measurements taken by an atomic-force microscope ( AFM) depend greatly on the properties of the spring and tip used to probe the sample’s surface. In this article, we describe a simple, nondestructive procedure for measuring the force constant, resonant frequency, and quality factor of an AFM cantilever spring and the effective radius of curvature of an AFM tip. Our procedure u...
متن کاملAtomic force microscopy of polymer brushes: colloidal versus sharp tips.
Force versus distance profiles acquired by atomic force microscopy probe the structure and interactions of polymer brushes. An interpretation utilizing the Derjaguin approximation and assuming local compression of the brush is justified when colloidal probes are utilized. The assumptions underlying this approach are not satisfied for sharp tips, and deviations from this model were reported for ...
متن کاملMethod for characterizing nanoscale wear of atomic force microscope tips.
Atomic force microscopy (AFM) is a powerful tool for studying tribology (adhesion, friction, and lubrication) at the nanoscale and is emerging as a critical tool for nanomanufacturing. However, nanoscale wear is a key limitation of conventional AFM probes that are made of silicon and silicon nitride (SiNx). Here we present a method for systematically quantifying tip wear, which consists of sequ...
متن کاملNanowear of Atomic Force Microscope Tips: Modeling and Experiments
In this paper, a simple analytical model to predict the nanowear of atomic force microscope tips is presented and experimentally validated. The model is based on the assumption that the energy consumed to remove the unit volume is a material/structural (i.e. size-dependent) parameter. Nanoscratch tests show that this hypothesis is plausible and, more importantly, that the specific energy is clo...
متن کاملStudy of the leakage field of magnetic force microscopy thin-film tips using electron holography
Electron holography is applied for the study of the leakage field of thin-film ferromagnetic tips used as probes in magnetic force microscopy. We used commercially available pyramidal tips covered on one face with a thin NiCo film, which were then placed in a high external magnetic field directed along the pyramid axis. Good agreement between simulated and experimental electron phase difference...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of the Magnetics Society of Japan
سال: 2013
ISSN: 1882-2924,1882-2932
DOI: 10.3379/msjmag.1302r003